Used MicroManipulator 6200

mm 6200 probe station

$Price per customer specification. S# 820784

Manual Probers

Bausch & Lomb Microscope Optics

Description

This 6200 Analytical Probing Station is set up for 5 inch wafers or packaged devices. Stability and high precision movements allow submicron geometrics to be readily viewed and probed. Conveniently located two-speed stage controls facilitate rapid wafer scanning and very precise positioning. The fast pullout stage feature facilitates changing wafers or packaged devices.

The vacuum stage is easily replaced within seconds by the optional socket stage which allows packaged devices to be conveniently powered and probed. It can then be easily replaced within seconds since stage planarity is permanently set at the factory. Probe cards can be used along with individually positioned probes by using the optional probe card holder.

Up to ten manipulators can be flexibly positioned on the 150 square inch platen which accepts vacuum or magnetic based manipulators. High resolution, excellent stability, and true planar vertical motion combine to make this probe platform exceptionally useful. It can be raised or lowered in submicron increments or quickly raised more than 1 inch in a second.

MicroZoom optics (listed above) are well supported on a massive microscope post affording full 1" x 1" x 1" X-Y-Z translation. Scanning of a device is facilitated by stage and optic movements which are permanently planarized at the factory.

The 6200 is fully compatible with the wide range of accessories and probes that make Micromanipulator test stations complete, powerful and flexible analytical systems. These optional interchangeable tools include the hot/cold stage, ultrasonic cutter, highest precision manipulators, various camera systems, ultra low capacitance and over 50 other types of specialized probes.

Specifications

What you need, when you need it!


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